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Kamiya, Junichiro; Kinsho, Michikazu; Yamazaki, Yoshio; Yoshimoto, Masahiro; Yanagibashi, Toru*
Journal of the Vacuum Society of Japan, 60(12), p.484 - 489, 2017/12
Multi-turn H
charge exchange injection is employed as a beam injection method in the 3-GeV RCS (Rapid cycling synchrotron) at J-PARC (Japan Proton Accelerator Research Complex). In this method, injection H beam is put on the same orbit as already circulating proton (H
) beam in a dipole magnetic field due to the opposite curvature of the injected and circulating beams. In the straight section, where the two beams coincide with each other, both beams are passed through a thin foil, which strips two weakly bound electrons off each H ion, forming an intense beam of protons. The thin foil, which is mostly made of carbon, would be the source of the outgassing, especially when its temperature rises due to the beam hitting. Therefore it is important to estimate the amount and components of the outgassing from the charge stripping foil. In this paper, we will report the thermal desorption measurement results for the several foil, which is used as the charge stripping foil in the RCS.
Ogiwara, Norio; Hikichi, Yusuke*; Kamiya, Junichiro; Kinsho, Michikazu; Yoshida, Hajime*; Arai, Kenta*
Journal of the Vacuum Society of Japan, 60(12), p.475 - 480, 2017/12
Baba, Yuji; Shimoyama, Iwao
no journal, ,
no abstracts in English
Fukaya, Yuki
no journal, ,
no abstracts in English
Shimoyama, Iwao; Baba, Yuji; Hirao, Norie*
no journal, ,
Polysilane has one-dimensional semiconducting electronic structure. Although the electronic property of polysilane thin film depends on orientation structure, the micro-orientation control method has not been established. We attempted orientation control for polydimethylsilane (PDMS) thin films by surface modification of graphite substrate using ion beam irradiation. Whereas PDMS thin film had flat-lying orientation on non irradiated graphite, random orientation was formed on Ar-irradiated graphite. And, we found that PDMS thin film had standing orientation on N
-irradiated graphite using near edge X-ray absorption fine structure spectroscopy. Furthermore, we deposited PDMS thin film on a graphite substrate which was irradiated by N ion beam through a grid with of 25
m periodicity and observed that the orientation structure of the PDMS thin film depended on the irradiated pattern using photoelectron emission microscopy. Based on these results, we concluded our method is available for micro-orientation control of polysilane films.
